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authorAna C <ana.cunha@ericsson.com>2015-12-26 15:50:13 +0100
committerAna Cunha <ana.cunha@ericsson.com>2016-01-08 10:57:42 +0000
commit93fb39a9436064c0b0fd85e3d69b23ceed4c1f1a (patch)
treec9fc73cb3ad8e229db3702477c1aaabe9f6c0d04 /samples/ping-serial.yaml
parentffdd523055d2395d1216c5fa0007ed6af0b6146e (diff)
Structure test case descriptions
This commit structures the test case descriptions. The file index.rst lists the subsequent chapters. 01-introduction.rst contains an overview of the project and deliverables. 02-methodology.rst describes the methodology for the generic test cases. 03-list-of-tcs.rst contains a list of merged generic test cases and a sub-chapter for the feature test cases. Glossary extracts definitions and abbreviations. TC001, TC002, TC008, TC009, TC010, TC012 were adapted to work for pdf. Template testcase_description_v2_template.rst was adapted to work for pdf. Change-Id: Ia11e27e5d508f1a784e2a412b50739e32b13797f Signed-off-by: Ana C <ana.cunha@ericsson.com> (cherry picked from commit 00296cd85133d4f38a510e7ad3ecb0ff3fe4d56c)
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