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2015-03-27TestSpec: Add LTD.Throughput.RFC2544.SoakMaryam Tahhan1-0/+26
Add a definition for RFC 2544 X% packet loss Throughput Soak Test Change-Id: I6cd457106548d01c3edd911b46f33e17aecd533b JIRA: VSPERF-14 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Signed-off-by: Al Morton <acmorton@att.com> Reviewed-by: Al Morton <acmorton@att.com>
2015-03-25TestSpec: Add LTD.Throughput.RFC2544.BackToBackFramesMaryam Tahhan1-0/+25
Add a definition for RFC 2544 Back To Back Frames Test. Change-Id: I15499eb6874227e189fa9828b8488f9c06c0b1a1 JIRA: VSPERF-12 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Signed-off-by: Al Morton <acmorton@att.com> Reviewed-by: Al Morton <acmorton@att.com>
2015-03-22TestSpec: Add LTD.Throughput.RFC2544.SystemRecoveryTimeMaryam Tahhan1-0/+30
Add a definition for RFC 2544 System Recovery Time Test. Change-Id: I2fa10e749616bdc1118f17a6024d30bedb1ede07 JIRA: VSPERF-11 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Al Morton <acmorton@att.com>
2015-03-11TestSpec: Add Throughput.RFC2544.PacketLossRatioFrameModificationMaryam Tahhan1-0/+41
Add a definition for RFC 2544 X% packet loss Throughput and Latency Test with packet modification. Change-Id: I0ca2e98b814d9b9eebd47293d6222ae8872c72a1 JIRA: VSPERF-7 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Signed-off-by: Al Morton <acmorton@att.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com> Reviewed-by: Aihua Li <aihua.li@huawei.com>
2015-03-11TestSpec: Add Throughput.RFC2544.PacketLossRatioMaryam Tahhan1-65/+105
Add a definition for RFC 2544 X% packet loss Throughput and Latency Test. This patch also addresses some indentation issues and fixes a typo. Change-Id: I58c50353df5f2e575bbd69fa2b41fa9fabf67ff2 JIRA: VSPERF-8 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Signed-off-by: Al Morton <acmorton@att.com> Reviewed-by: Aihua Li <aihua.li@huawei.com> Reviewed-by: Gene Snider <eugene.snider@huawei.com>
2015-02-26TestSpec: Add ApproachMaryam Tahhan1-2/+400
Add the approach section to the LTD. Approach covers: - The general methodology. - Default test parameters. - Test Priority. - DUT setup. - Port configuration. - Frame formats. ... Change-Id: I2df8b87f9a36d71156797f6eb0cabd196c3a1100 JIRA: VSPERF-6 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Al Morton <acmorton@att.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com>
2015-02-26TestSpec: Specify Features to be testedMaryam Tahhan1-8/+31
Add specification for the features to be tested. Change-Id: Id527778d57c047c00da1c437bb0ddcea3d1026e8 JIRA: VSPERF-4 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Al Morton <acmorton@att.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com>
2015-02-13test_spec: Add Introduction to test specMaryam Tahhan1-0/+61
Added an initial test spec with the introduction to kick off the review process. Change-Id: I0ab8fd8724fe114aec502882fccb8a72450b67df JIRA: VSPERF-3 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com> Reviewed-by: Aihua Li <aihua.li@huawei.com>