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2015-02-26TestSpec: Add ApproachMaryam Tahhan1-2/+400
Add the approach section to the LTD. Approach covers: - The general methodology. - Default test parameters. - Test Priority. - DUT setup. - Port configuration. - Frame formats. ... Change-Id: I2df8b87f9a36d71156797f6eb0cabd196c3a1100 JIRA: VSPERF-6 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Al Morton <acmorton@att.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com>
2015-02-26TestSpec: Specify Features to be testedMaryam Tahhan1-8/+31
Add specification for the features to be tested. Change-Id: Id527778d57c047c00da1c437bb0ddcea3d1026e8 JIRA: VSPERF-4 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Al Morton <acmorton@att.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com>
2015-02-13test_spec: Add Introduction to test specMaryam Tahhan1-0/+61
Added an initial test spec with the introduction to kick off the review process. Change-Id: I0ab8fd8724fe114aec502882fccb8a72450b67df JIRA: VSPERF-3 Signed-off-by: Maryam Tahhan <maryam.tahhan@intel.com> Reviewed-by: Tim Irnich <tim.irnich@ericsson.com> Reviewed-by: Aihua Li <aihua.li@huawei.com>